Zettl Research Group |
Research Project |
SCANNING TUNNNELING MICROSCOPE
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A Scanning Tunneling Microscope is a non-optical apparatus which directly measures electronic states. With precision control, the microscope can obtain atomic resolution by imaging the states of individual atoms. On a surface, the microscope is also sensitive to localized defect states and quantum confined states.
Placing the microscope into an Ultra High Vacuum environment allows for controlled surface preparation. Operation in air or other "dirty" environments complicates the interpretation of atom-sized features. In a clean environment, however, both the surface and the atoms placed upon it can be carefully controlled.
Any of the systems described above may be modified in situ. Modifications are a powerful tool for understanding a new material and probing its properties. Doping, or intercalation, of a material with donor atoms is one method of changing a material. For example, some superconductors are quite sensitive to doping levels. Another modification method is the tip-induced production of local defects in a material. Such defects in a mesoscopic conductor, for example, may dominate the transport properties. A "quantum corral," as built by researchers at IBM Almaden, is another example of a special local potential which can be formed by this instrument.
Low temperature ultra high vacuum scanning tunneling microscope
We have built a low temperature ultra high vacuum scanning tunneling microscope (STM) designed specifically to study nanoscale structures on surfaces. The microscope operates at 4.9 Kelvin. The entire UHV system has a base pressure of 1.8 x 10-10 Torr, and has a variety of in-situ sample preparation capabilities including substrate temperature control, thermal and e-beam evaporation, ion beam sputtering, and low-coverage surface dosing. The system also includes LEED and Auger analysis for further surface characterization. STM can be fitted with a split-coil magnet to apply a 5.5 Tesla rotatable field to samples.
This microscope will aid in the characterization of new materials and provide insights into nanoscale electronic elements. Using this instrument, it is possible to immediately characterize novel purified nanomaterials synthesized in our laboratory.
We have variable temperature STM/AFM capable of imaging samples from 20 to 1000 K purchased from RHK. The microscope has optical access to the sample, quick sample turn around time, and tip-exchange capability. The microscope system includes standard surface analysis chamber with Auger and LEED and preparation chamber with electron beam evaporators. We use the system to investigate properties nanoscale structures using novel scanning probe techniques such as spin-polarized tunneling and STM-induced photoluminescence.
Bundle of carbon nanotubes
[Image by Low temperature UHVSTM]
Au (111)
[Image by Low temperature UHVSTM]